NOC:Transmission Electron Microscopy: Theory of Imaging to Advanced Applications

Lecture 1 - Intro to Transmission Electron Microscopy (TEM)

Lecture 2 - Layout of TEM, lab tour and overview of components

Lecture 3 - Electron Sources: Types of Electron Sources

Lecture 4 - Electron Sources: Charateristics and influence on imaging

Lecture 5 - Electron Lenses

Lecture 6 - Image Formation in TEM and Function of a Lens - Part 1

Lecture 7 - Image Formation in TEM and Function of a Lens - Part 2

Lecture 8 - Apertures, Detectors and Specimen Preparation

Lecture 9 - Signals in a TEM

Lecture 10 - Scattering Cross Section and Projected Potential

Lecture 11 - More on electron-specimen interaction

Lecture 12 - Contrast mechanisms in conventional TEM

Lecture 13 - Basic conventional TEM operation, handson demonstration on LaB6 TEM - JEOL JEM 2100

Lecture 14 - Basic conventional TEM operation, handson demonstration on Cold FEG TEM - JEOL JEM F200

Lecture 15 - Interpreting simple images in conventional TEM

Lecture 16 - Introduction and overview of electron diffraction techniques

Lecture 17 - Basics of crystallography to understand electron diffraction - Part 1

Lecture 18 - Basics of crystallography to understand electron diffraction - Part 2 A

Lecture 19 - Basics of crystallography to understand electron diffraction - Part 2 B

Lecture 20 - Demonstration of orienting crystal and obtaining diffraction pattern on TEM

Lecture 21 - Understanding electron diffraction patterns

Lecture 22 - Indexing electron diffraction patterns

Lecture 23 - High-resolution Imaging in TEM

Lecture 24 - HREM - Linear imaging theory and image formation mechanisms

Lecture 25 - HREM - Multiwave imaging concepts and extension to real specimens

Lecture 26 - HREM - Demonstration on microscope

Lecture 27 - Scanning transmission Electron Microscopy - Concepts

Lecture 28 - Scanning transmission Electron Microscopy - Methodology

Lecture 29 - STEM - Demonstration on the microscope - Experimental Demonstration

Lecture 30 - Inelastic scattering and Analytical TEM

Lecture 31 - Intro to EELS and EFTEM

Lecture 32 - More on EELS and applications

Lecture 33 - Aberration correction in TEM

Lecture 34 - Demonstration on Image Corrector TEM - JEOL NeoARM 200F

Lecture 35 - Demonstration on Probe Corrected TEM - JEOL NeoARM 200F

Lecture 36 - Tutorial on Basic Image Operations with Digital Micrograph and ImageJ

Lecture 37 - In‑situ and Environmental TEM using MEMS

Lecture 38 - Course Summary - TEM, Theory of Imaging to Advanced Applications - Part 1

Lecture 39 - Course Summary - TEM, Theory of Imaging to Advanced Applications - Part 2